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the wave™
nanotechnologie,nanoteknologi,nanotecnologia,
nanotehnoloogia, nanoteknologia, nanotechnologija, nanotehnologijas, nanoteknologija,
nanotechnologii, nanotecnologia, nanotehnologijo, nanoteknik
2006
Nano
Elekronik...Nano
Electronics...Nano
Elektronica
www.nanotsunami.com
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Applied
Materials and IMEC, Europe's leading independent
nanoelectronics and nanotechnology research center,
announced today a significant joint effort to develop
32nm and 22nm-node copper/low k interconnect processing
technologies using a suite of Applied Materials'
most advanced systems. The goal of the joint program
is to address critical manufacturing challenges that
chipmakers may face as they transition to future
device generations, helping them to bring new products
to market more rapidly while minimizing risk.
Applied's work with IMEC is part
of IMEC's nanoelectronics research platform, which
includes leading chipmaker partners Infineon, Intel,
Panasonic/Matsushita, Philips Semiconductors, Samsung,
STMicroelectronics, Texas Instruments and TSMC.
Dr. Luc Van den hove, vice president, Silicon Process and Device Technology of
IMEC, said, "We selected Applied Materials as one of our key equipment providers
for our core program on sub-45nm CMOS research, which is being carried out in
cooperation with leading IC manufacturers. This critical development program
will build on Applied Materials' extensive integration expertise in interconnect
technology, especially in the areas of advanced low k dielectrics and copper
conductors. With this new set of Applied interconnect systems we will have world-class
capability for developing the sub-32nm generation back end process flow, and
we expect to be collecting 32nm data from this tool set by the end of 2006."
As part of the joint program, Applied Producer CVD systems will be installed
at IMEC, including tools to deposit Black Diamond II with Nanocure UV curing
technology and BLOk low k films. An Applied Reflexion LK CMP system will be used
for copper/low k planarization, featuring advanced process control and low downforce
technology for polishing low k dielectric materials. An Applied Slimcell ECP
system will be delivered to provide next-generation profile control of critical
copper layers, and the Applied Endura Barrier/Seed system with the latest preclean
technology will be used to deposit the critical barrier and seed layers in nanometer-scale
features with superior step coverage using ALD and PVD technologies.
"This alliance between IMEC and
Applied Materials enables us to utilize a broad range
of our industry-leading interconnect technologies
to develop highly integrated, high-performance 32nm
and below manufacturing processes," said Dr. Farhad
Moghadam, senior vice president and general manager
of Applied Materials' Thin Films Group. "This kind
of expert collaboration is essential to better understand
the complex interface engineering and circuit scaling
issues that our customers will face with advanced
technology nodes."
Source: IMEC
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