Company (Nasdaq: FEIC) have announced that scientists
at the company's nanotechnology center have broken
the one Angstrom image resolution barrier with a 200kV
transmission electron microscope (TEM). FEI believes
that this is the first time images can be directly
viewed with a resolution of less than one Angstrom
using commercially available technologies. One Angstrom
isone-tenth of a nanometer in size, and a nanometer
is one billionth of a meter. One Angstrom is also
approximately one-third the size of a carbon atom
and is a key dimension for atomic level research.
the ability to attain direct artifact-free images
of atoms, the doors have been opened for researchers
working in nanotechnology development to explore materials
at the highest resolution ever. The sub-Angstrom resolution
was achieved using FEI's Tecnai(TM) F20 ST transmission
electron microscope, using technologies which improve
image resolution with advanced electron optics capabilities
developed by FEI and by its partner, CEOS Company.
This enables novel TEM techniques such as 3D reconstruction
with tomography, scanning probe applications, or in
situ observation of specimen responses to variations
in temperature, stress or chemical environment, all
with sub-Angstrom resolutions.
in nanotechnology have hailed the FEI achievement.
"The successful use of an electron beam monochromator
to improve the resolution of a Cs-corrected electron
microscope marks a major milestone for the field of
electron microscopy," stated Dr. Michael O'Keefe
of the National Center of Electron Microscopy in Berkeley,
California. "Theory has long predicted that a
monochromator would be able to push the resolution
of the super-twin lens beyond the 1.4A resolution
demonstrated with Cs- correction alone. However, the
difficulties involved in implementation of a monochromator
compromising the imaging qualities of the electron
beam are well-known. FEI deserves to be congratulated
for this outstanding achievement."
Prof. Dr. Hannes Lichte of the Faculty of Mathematics
and Natural Sciences, Institute of Structure Physics
at Dresden University in Germany, commented, "For
the first time, the authors convincingly show that
in a Cs-corrected TEM by additional reduction of energy
spread using a gunmonochromator, they extend the total
information limit to significantly better than 0.1nm.
As evident from their diffractograms, they are not
far off the theoretical limit of about 0.07nm in at
least some direction.Congratulations!"
"FEI remains the world leader in high resolution
imaging and an important enabler for the world's growing
nanotechnology industry," said Vahe Sarkissian,
FEI's chairman, president and chief executive officer.
"In every market we serve, we are delivering
the tools needed to research and develop new products
and devices. Our tools will continue to serve nano-driven
markets as new products are commercialized and high
volume manufacturing requires process control and
diagnostics at the nanoscale."
Dr. Max Haider, co-founder and Managing Director of
CEOS, said, "A long-time ongoing dream, to achieve
sub-Angstrom resolution, has now been attained with
a 200 kV TEM equipped with a Cs-corrector (developed
by CEOS) and a monochromator (developed by FEI). This
success is the result of the combination of advanced
components into one instrument, to attain an unprecedented
level of resolution." CEOS (Corrected Electron
Optical Systems) Company of Heidelberg, Germany, is
concentrating on the development of advanced correction
systems for high-resolution electron microscopy.
are proud of this milestone which sets the stage for
even greater breakthroughs," said Dr. Rob Fastenau,
senior vice president of FEI's Electron Optics Division.
"This achievement is directly related to our
proven commitment to advanced electron microscopy.
FEI was the first to combine TEM with Cs-correctors
in the late 90's, and FEI was the first in 2000 with
proven monochromator technology. Today, FEI is the
first to combine these advanced technologies in an-easy-to-use
system that breaks the Angstrom barrier."
Company provides advanced Tools for Nanotech to a
range nanotechnology markets, including materials
science, life science, semiconductors, and data storage.
Its ion beam and electron beam products, market-leading
DualBeam(TM) systems, and productivity-enhancing automation
software packages enable researchers and manufacturers
to fabricate and modify nanoscale structures and to
view and to characterize them in three dimensions
down to the atomic level. The company and its predecessors
have been paving the way for nanoscale exploration
and discovery since 1946. FEI Company currently has
more than $360 million in revenue, consistent operating
profitability, manufacturing and development facilities
in North America and Europe, and service operations
in more than 40 countries worldwide.
more information visit: www.feicompany.com