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HILLSBORO,
Ore., March 1, 2005 /PRNewswire-FirstCall via COMTEX/
-- FEI Company (Nasdaq: FEIC) today released the newest
member of its Nova(TM) family of SEM and DualBeam(TM)
systems, the Nova NanoSEM. It is the world's first
low-vacuum, field emission scanning electron microscope
(FEG-SEM) solution for ultra-high resolution characterization
of charging and/or contaminating samples such as organic
materials, substrates, porous materials, plastics
and polymers. This newest system joins FEI's growing
line of market-leading tools that are enabling nanoscale
research, development and manufacturing in a diverse
range of markets and applications.
The Nova NanoSEM brings
new capabilities to researchers and developers working
with non-conductive and contaminating nanoscale materials.
FEI's Helix detector technology, introduced with the
Nova NanoSEM, combines magnetic immersion lens and
low-vacuum SEM technologies for the first time in
the history of field emission scanning electron microscopy.
The combined effect delivers ultra-high resolution,
low-vacuum characterization capabilities in an environment
that suppresses charge build-up on non-conductive
materials. The unique technology incorporated in the
Nova NanoSEM also suppresses electron-beam induced
contamination resulting from previous sample processing
steps.
"The Nova NanoSEM,
with its proprietary optics and detection systems,
was developed to meet the growing needs of customers
who are faced with evolving applications and expanding
challenges," commented Tony Edwards, FEI's business
line manager for SEM and small DualBeam products.
"FEI led the market with its ESEM technology
for charging and non-coated samples. Now it extends
its leadership by combining the most advanced low-vacuum
and ultra-high resolution design features for these
challenging yet critical sample types."
The Nova NanoSEM also
features in-lens as well as low-vacuum secondary and
back scatter electron (BSE) imaging modes, and FEI's
proprietary beam gas chemistries for e-beam writing
of nanostructures, making it the ideal SEM for research
and advanced study of nano-structures and nano-materials.
The growing complexity
and shrinking dimensions of materials, devices and
biological samples, have resulted in increased demand
for nanoscale characterization tools across all markets
served by FEI. In 2004, FEI was the first electron
optics manufacturer to deliver sub-Angstrom or atomic
scale resolution on a commercially available transmission
electron microscope. With the Nova NanoSEM and its
other tools for enabling nanotechnology, FEI continues
to lead advances in ultra-high resolution characterization
and analysis of a wide variety of samples at nanoscale
dimensions.
About FEI
FEI's Tools for Nanotech(TM),
featuring focused ion- and electron-beam technologies,
deliver 3D characterization, analysis and modification
capabilities with resolution down to the sub-Angstrom
level. With R&D centers in North America and Europe
and sales and service operations in more than 40 countries
around the world, FEI is bringing the nanoscale within
the grasp of leading researchers and manufacturers
and helping to turn some of the biggest ideas of this
century into reality. More information can be found
on the FEI website at: http://www.feicompany.com.
SOURCE FEI Company
Dan Zenka, APR, Corporate
Communications of FEI Company, +1-503-726-2695, or
dzenka@feico.com; or Cathy van Mastrigt, Marketing
Communications of FEI Company,
Europe, +31-40-276-6225, or cathy.van.mastrigt@feico.com
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