HILLSBORO,
Ore., Nov. 10 /PRNewswire-FirstCall/ -- Ohio State
University's Center for Accelerated Maturation of
Materials (CAMM) has become the first North American
site to install and begin using the world's highest-resolution,
commercially-available scanning/transmission electron
(S/TEM) microscope, the FEI ( NASDAQ:FEIC )
Titan(TM) 80-300. This new system yields powerful
sub-Angstrom (atomic scale) imaging and analysis
capabilities.
With the sub-Angstrom imaging of the Titan, researchers
at Ohio State's CAMM labs will have a greatly enhanced
ability to make new discoveries on the structure-property
relationships of a wide spectrum of materials. Close
coupling of computational methods with the now more
detailed experimental validation at the atomic level
will make new materials development cycles much shorter
at significantly reduced costs.
"CAMM embarked upon a joint project with FEI Company
to develop an advanced S/TEM platform aimed at providing
researchers with an accurate physical picture of
the materials they are modeling," said Dr. Hamish
Fraser, director of CAMM. "We are happy and enthusiastic
to see that it has resulted in such a powerful tool
-- on time and beyond performance expectations --
that will play an indispensable role in our effort
to develop new methods for sophisticated characterization
and computational models to accelerate new materials
development cycles. The demonstrated quality and
stability -- from crate to sub-Angstrom in just one
week -- has created excitement among our students
and post doctorates."
The Titan's dedicated platform for corrector and
monochromator technologies is highly automated and
provides leading-edge stability, performance and
flexibility. The microscope enables deep sub-angstrom
resolution making way for the highest performance
available in both transmission electron microscopy
(TEM) and scanning transmission electron microscopy
(STEM) modes. The Titan's upgradeable design not
only enables larger nanotechnology and national research
centers to afford dedicated aberration corrected
TEM technology, it opens the door to universities
and companies with staged funds to position themselves
for the future.
"The FEI Titan S/TEM is an extraordinarily powerful
and stable system," said Rob Fastenau, senior vice
president of FEI's NanoResearch and NanoBiology market
divisions. "Shortly after the installation at Ohio
State was completed, the system was able to produce
an information limit around 0.7 Angstrom and atomic
resolution in STEM mode within minutes of each application.
It is this very flexibility, stability and performance
that will allow combining ultimate information with
new results and have high analysis throughput."
The Titan S/TEM was introduced in August of this
year. Additional installations of the first-shipped
systems will soon be completed in North America and
Europe.
About CAMM
CAMM at Ohio State University is a unique collaboration
between government, industry and academia chartered
to develop new methods to accelerate the maturation
of materials technologies. It seeks to combine computational
tools with thorough experimental validation, and
one of its tasks is the development of new experimental
tools, where needed. The joint development of this
new tool is an excellent example of the collaborative
efforts that are required to maintain a competitive
position in industrial segments that depend on evolving
materials technologies.
About FEI
FEI's
Tools for Nanotech(TM), featuring focused ion-
and electron-beam technologies, deliver 3D characterization,
analysis and modification capabilities with resolution
down to the sub-Angstrom level. With R&D centers
in North America and Europe and sales and service
operations in more than 40 countries around the world,
FEI is bringing the nanoscale within the grasp of
leading researchers and manufacturers and helping
to turn some of the biggest ideas of this century
into reality. More information can be found on the
FEI website at: http://www.feicompany.com/ .
This news release contains forward-looking statements
that include statements about future performance
and new applications of, and development work through,
our Titan TEM. Factors that could affect these forward-looking
statements include but are not limited to the inability
of customers to develop and deploy the expected new
applications or to achieve the development work.
Please also refer to our Form 10-K, Forms 10-Q, Forms
8-K and other filings with the U.S. Securities and
Exchange Commission for additional information on
these factors and other factors that could cause
actual results to differ materially from the forward-looking
statements. FEI assumes no duty to update forward-looking
statements.
Source: FEI Company
CONTACT: Dan Zenka, APR, Director, Worldwide Public
Relations of FEI
Company/Corporate Headquarters, +1-503-726-2695, or dzenka@feico.com
Web site: http://www.feicompany.com/
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