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Germany's Ernst Ruska Center and FEI
Join in Partnership Program
The Center's development project
with FEI will advance sub-atomic resolution electron
microscopy for analyzing atoms and their bonds
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HILLSBORO,
Ore., Aug. 2 /PRNewswire-FirstCall/ -- FEI Company (Nasdaq:
FEIC) announced today that Germany's leading national
center for Microscopy and Spectroscopy with Electrons
-- the Ernst Ruska Center -- has selected FEI Company
as a partner for developing the next era of analytical
microscopy. A 300kV Scanning/transmission electron microscope
(S/TEM) purchased by the Ernst Ruska Center will deliver
integrated capabilities for imaging and chemical analysis
of matter with ultimate resolutions crossing the 1-Angstrom
barrier. One Angstrom is one-tenth of a nanometer, approximately
one-third the size of a carbon atom, and is a key dimension
for atomic level research.
This ultra-high resolution S/TEM system and developed
applications will open doors for researchers to study
morphology, crystallography, elemental and chemical
composition, as well as electronic structure at resolution
levels not demonstrated before in a single advanced
instrument. Moreover, with the ability to look between
atoms, researchers will be able to study the chemical
nature of atoms and what holds them together. This advanced
S/TEM features a proprietary FEI platform for aberration
corrected microscopy and advanced optics. Its design
meets the stringent demand of ultra high stability to
allow resolutions well below 1 Angstrom, for transmission
and scanning probe operation (STEM), in one system.
The microscope can be operated up to 300kV for ultimate
brightness, current and resolution, delivering the best
imaging and analysis performance available.
"It is our mission to provide German users with
cutting-edge equipment in atomic resolution electron
microscopy and spectroscopy which, due to the advent
of aberration-corrector technology, has become one of
the most innovative fields of analytical instrumentation,"
commented Professor Dr. Knut Urban, the president of
the German physical society and co-director of the recently
established Ernst Ruska Center. "FEI has proven
to be an international key player in this area. The
partnership with FEI will allow us to stay at the forefront
of instrumental development."
Professor Dr. Joachim Mayer, co-director of the Center
added: "Electron Microscopy is making a quantum
leap towards an experimental technique in which the
information on an atomic object is no longer limited
by the optical qualities of the instrument. Physicists
and materials scientists worldwide are looking forward
to carrying out high-precision measurements on properties
of atomic structures urgently needed in nanosciences.
FEI technology will allow the Ernst Ruska Center's users
to exploit these fascinating possibilities."
"We are proud to be selected by Germany's leading
center for ultra-high resolution analytical microscopy,"
said Vahe' Sarkissian, FEI's chairman, president and
chief executive officer. "FEI remains the world
leader in high resolution imaging and analysis and an
important enabler for the world's growing nanotechnology
applications. In every market we serve, we are delivering
the tools needed to research and develop new nanoscale
products and devices. We believe that this relationship
will result in important breakthroughs for advanced
microscopy."
In March of this year, FEI announced the first-ever
sub-Angstrom resolution obtained on a commercially available
200 kV TEM. Recognizing the scientific demand for aberration
corrected TEM/STEM applications, FEI has developed an
advanced TEM/STEM 300 kV system that achieves sub-angstrom
resolution without the aid of correctors or a monochromator.
Going forward, this new system will also be available
with aberration correctors and a monochromator. The
addition of these technologies on such an advanced platform
will bring nanoscience into routine sub-angstrom research,
providing researchers and manufacturers greater access
to the sub-nanoscale.
About FEI
FEI's Tools for Nanotech(TM), featuring focused ion-
and electron-beam technologies, deliver 3D characterization,
analysis and modification capabilities with resolution
down to the level. With R&D centers in North America
and Europe, and sales and service operations in more
the 40 countries around the world, FEI is bringing the
nanoscale within the grasp of leading researchers and
manufacturers and helping to turn some of the biggest
ideas of the this century into reality. More information
can be found on the FEI website at: www.feicompany.com
About Ernst Ruska Center (ER-C)
The ER-C for Microscopy and Spectroscopy with Electrons
is jointly operated by the Research Center Juelich and
the Technical University of Aachen, under the auspices
of the German Science Foundation and the joint directorship
of Professors Knut Urban and Joachim Mayer. The Center
unites two groups, at Aachen and Juelich, with the largest
instrumental and personnel resources in the field of
electron microscopy in Germany. Operated as a user facility,
the Center provides German universities, research laboratories
and industry with the most advanced high-resolution
and analytical electron microscopy using monochromators,
analytical energy filters and aberration corrector elements.
The main fields of activity comprehend the analysis
of nanostructured ceramics, metals, semiconductors and
oxide superconductors together with lattice defects.
For more information visit: www.er-c.org.
SOURCE FEI Company
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